深圳湾边贸易进口代理Amptek X-123 X射线探测器价格优惠！Amptek X射探测系统，Amptek X光检测仪，  Amptek手执X射线探测器价格优惠！

X-123是一个完整的可手执的X射线探测系统。X-123标志着Amptek 14年的X射线探测器研发成果。AMPTEK一直致力于开发小型、低功率、高性能、易操作的仪器。X-123是AMPTEK这一宗旨的一个例子，它提供一个套装的XR100 X射线探测器和电荷敏感前置放大器，DP4数字脉冲处理器和脉冲整形器、多通道分析器及数据接口、以及PC4-3电源。你只需要一个5伏的直流电源和一根USB或RS232接线与你的计算机相连。

The X-123 is a complete X-Ray Detector System in one small box that fits in your hand.

Ideal system for use in RoHS/WEEE compliance XRF machines.

X-123 represents the culmination of 14 years of X-ray detector development at Amptek. Our philosophy has always been to create small, low power, high performance instruments while keeping them simple to operate. The X-123 exemplifies this philosophy by providing in a single package theXR100CRX-Ray Detector and its Charge Sensitive Preamplifier; theDP5Digital Pulse Processor with pulse chaper, MCA, and interface; and the PC5 Power Supply.All that is needed is a +5 Volts DC input and a USB or RS232 connection to your computer.

X-123 Description

Amptek抯 specialty is X-ray spectrometers, which are small, low power, high performance, and simple to operate. The X123 combines in a single package Amptek抯 standard, high performance X-ray spectroscopy components: the XR100CR detector and preamplifier, DP5 digital pulse processor and MCA, and PC5 power supply. The result is a complete integrated system which can fit in your hand. In many commercially available systems, the preamplifier alone has more size, mass, and power than this integrated system. It requires only 2 connections to run: +5 VDC power and a standard RS-232 or USB bus. With the X-123, anyone can rapidly obtain high quality X-ray spectra.

The typical detector is a Si-PIN photodiode: X-rays interacting in the silicon create an average of one electron/hole pair for every 3.62 eV of energy lost in the silicon, which is the input signal.

The detector is mounted on a thermoelectric cooler along with the input FET and coupled to a custom charge sensitive preamplifier. The thermoelectric cooler reduces the electronic noise in the detector and preamplifier, but the cooling is transparent to the user: it operates like a room temperature system. The charge-sensitive preamplifier uses a novel feedback technique, injecting reset pulses through the high voltage connection to the detector.

The pulse processor is the DP5, a digital pulse processor which replaces both the shaping amplifier and multichannel analyzer (MCA) found in most analog systems. The use of digital technology improves several key parameters: (1) better performance, specifically better resolution and operation at higher count rates; (2) greater flexibility since more configuration options are available and they are selected by software over a RS-232 interface, and (3) improved stability and reproducibility. The DP5 digitizes the preamplifier output, applies real-time digital processing to the signal, detects the peak amplitude (digitally), and bins this value in its histogramming memory, generating an energy spectrum. The spectrum is then transmitted over the DP5抯 interface to the user抯 computer. The Amptek DP5 has 6 main function blocks to implement these functions: (1) an analog prefilter; (2) an ADC; (3) a digital pulse shaper; (4) pulse selection logic; (5) histogram logic, and (6) interfacing hardware (which includes a microcontroller) and software.

The power supply is Amptek抯 PC5, a single board. The input is approximately +5 VDC with a current of about 200 mA. The PC5 uses switching supplies to produce all the low voltages required for the digital processor and the preamplifier. It also includes a high voltage multiplier to produce the detector bias voltage, up to 400 V, and supply for the thermoelectric cooler which provides closed loop control with a maximum temperature differential of 85 °C. Both of these supplies are adjusted at the factory for a particular detector.

The complete system is packaged in 7 x 10 x 2.5 cm3 aluminum box, with the detector mounted on an extender. In its standard configuration, only two connections are required: power (+5 VDC) and serial (either USB or RS232). The DP5 board supports several additional inputs and outputs, if the X123 will be integrated with other equipment. This includes an MCA gate, a memory buffer select signal, timing outputs, and SCA ouputs. Please contact Amptek Inc. or see the DP5 specifications for further information.

Figure 4. X-123 Architecture and Connection Diagram

X-123 Specifications

Options

• Other Beryllium window thicknesses are available on special order (0.3 mil - 7.5 µm).
• Collimator Kitfor high flux applications.
• Vacuum Accessories
• OEM Applications

Figure 5. X-123 detector extender options.

Figure 6. X-123 with the PA-230 preamplifier and housing. This option is the same as the X-123 except the detector/preamplifier have been removed from the electronics box and connected with a flexible cable. Provided in order to operate the detector remotely from its electronics box. See theOEMpage for more information.

Figure 7. Resolution vs. Peaking/Shaping Time for Si-PIN and SDD Detectors.

Figure 8. Resolution vs. input count rate (ICR) for various peaking times.

Figure 9. Throuhgput, input vs. output count rate.

Use of Collimators

Most of Amptek抯 detectors contain internal collimators to improve spectral quality. X-rays interacting near the edges of the active volume of the detector may produce small pulses due to partial charge collection. These pulses result in artifacts in the spectrum which, for some applications, obscure the signal of interest. The internal collimator restricts X-rays to the active volume, where clean signals are produced. Depending on the type of detector, collimators can

• improve peak to background (P/B)
• eliminate edge effects
• eliminate false peaks

Click here for more information.

Vacuum Operation

The X-123 can be operated in air or in vacuum down to 10^-8Torr. The X-123 can be connected to the vacuum chamber through a standard Conflat compression O-ring port. Optional Model EXV5 (5 inch) or EXV9 (9 inch) vacuum detector extender is available for this application. See figure 5 above.Click here for more information on vacuum applications and options.

Efficiency Curves

Figure 10 (linear). Shows the intrinsic full energy detection efficiency for the X-123 Si-PIN detectors. This efficiency corresponds to the probability that an X-ray will enter the front of the detector and deposit all of its energy inside the detector via the photoelectric effect.

Figure 11 (log). Shows the probability of a photon undergoing any interaction, along with the probability of a photoelectric interaction which results in total energy deposition. As shown, the photoelectric effect is dominant at low energies but at higher energies above about 40 keV the photons undergo Compton scattering, depositing less than the full energy in the detector.

Both figures above combine the effects of transmission through the Beryllium window (including the protective coating), and interaction in the silicon detector. The low energy portion of the curves is dominated by the thickness of the Beryllium window, while the high energy portion is dominated by the thickness of the active depth of the Si detector. Depending on the window chosen, 90% of the incident photons reach the detector at energies ranging from 2 to 3 keV. Depending on the detector chosen, 90% of the photons are detected at energies up to 9 to 12 keV.

Efficiency Package:A ZIP file of coefficients and a FAQ about efficiency. This pacakge is provided for general information. It should not be used as a basis for critical quantitative analysis.

X-123 Application: RoHS/WEEE Compliance

The RoHS / WEEE [Restriction of Hazardous Substances / Waste from Electrical and Electronic Equipment] directive requires that the electronics industry certify that products comply with maximum concentration amounts of particular elements and compounds (Cr VI, Pb, Cd, Hg, Br PBB/PBDE) by July, 2006. The X-123 can be used to verify compliance with the RoHS/WEE requirements as part of a quality assurance program, via XRF. It permits users to measure the concentration of the specified elements, quickly, accurately, and non-destructively. Companies can verify supplier compliance and demonstrate their own compliance. The X-123 provides OEMs and end users with a powerful X-Ray Spectrometer system in one convenient, small, easy to use instrument that can be quickly implimented to minimize time to market. No additional engineering is required on teh spectrometer end since all the connections have been made internally. All that is needed is a +5 VDC input power and a USB or RS232 connection to a computer.

The X-123 does not sacrifice performance for size. The resolution for the 5.9 keV peak of⁵⁵Fe is 145 eV FWHM to 260 eV FWHM depending on the detector type and peaking time. Since the X-123 is a complete packaged spectrometer, it is the perfect choice for fast-track product development and will provide the OEM with the quickest time to market.

Figure 12. RoHS/WEEE Example Spectrum.

X-123 Typical Si-PIN Results

Figure 13. X-ray fluorescence (XRF) of multi-element sample from¹⁰⁹Cd.

Figure 14. X-Ray Fluorescence (XRF) of lead (Pb) from¹⁰⁹Cd.

Figure 15. X-Ray Fluorescence (XRF) of a few locations on a PC board from¹⁰⁹Cd.

Figure 16. X-Ray Fluorescence (XRF) of a various elements from¹⁰⁹Cd.

Mechanicals

Mechanical Dimensions

Figure 17.

Mounting Hardware

Figure 18. X-123 with mounting plate and right angle bracket.

Figure 19. X-123 Mounting Plate.

Figure 20. X-123 right angle mounting bracket.

Complete XRF System

See theExperimenter's XRF Kit.