泰克电流探头TDP1000
价格:电议
地区:
电 话:86-020-83802175-8011
手 机:18022342323
产品品牌:
泰克TEK
产品型号:
TDP1000

1 GHz and 500 MHz High Voltage Differential Probes

TDP1000 • TDP0500 • P6251 • P6250

Features & Benefits

Outstanding Electrical Performance
  • 1 GHz and 500 MHz Probe Bandwidth
  • <1 pF Differential Input Capacitance
  • 1 MΩ Differential Input Resistance
  • ±42 V (DC + pk AC) Differential Input Voltage
  • >18 dB CMRR (at 250 MHz 50x attenuation)
  • Selectable Bandwidth-limiting Filters
  • DC Reject
Versatile DUT Connectivity
  • Small Compact Probe Head for Probing Small Geometry Circuit Elements
  • Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
  • Robust Design for Reliability
Easy to Use
  • Provides Automatic Units Scaling and Readout on the Oscilloscope Display
  • TDP1000, TDP0500
    • Connect Directly to the DPO7000, DPO4000, and MSO4000 Series Oscilloscopes Using TekVPI™ Probe Interface (No additional power adapters required)
    • Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
    • AutoZero – Zeros Out Output Offset
  • P6251, P6250
    • Connect Directly to TDS5000 and other TekProbe™ Interface Oscilloscopes, or to TekConnect® Oscilloscopes Using TCA-BNC Adapter

Applications

  • High-speed Switch Mode Power Supply Design
  • CAN/LIN Bus Design
  • High-speed Digital Design
  • Digital Design and Characterization
  • Manufacturing Engineering Test
  • Research and Development

The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

  • Outstanding Electrical Performance
  • Versatile Device-Under-Test Connectivity
  • Ease of Use