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非接触型便携式高电阻率/膜厚/PN检测仪
价格：电议
地区：广东
电 话：86 0769 88332629
手 机：15989217969
传 真：86 0769 86631553

广东博德仪器有限公司

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类型涡流探伤仪品牌日系
型号EC-80TPN测量范围极广
分辨率极高尺寸45x50x35（mm）
重量3（kg）

非接触式电阻率/厚度/PN-All-in-one检测仪(EC-80TPN)

EC-80
Non-contact sheet resistance /resistivity measurement instrument

  • All-in-one tool for simultaneous resistivity,thickness,and PN measurement
  • 5 sites measurement mode for resistivity and thickness(option)
  • Easy operation and compact design
  • Auto-measurement start by inserting a wafer under the sensor
  • Easy mode change of resistivity and sheet resistance measurement
  • Easy set up to measurement condition by JOG dial
  • 5 types of model for each measuring range

Applications:

Silicon wafer, GaAs (Epi), GaN, GaP, InP, ITO, Metal thin film, Solar cell (Silicon wafer, Thin film)

Wafer sizes:

2∼8 inch,∼156 mmSQ

Measuring range:

[R] 0.001∼200Ω?cm
[RS] 0.01∼3,000Ω/sq